Constructing indicators from patent specifications: What they reveal and what they imply?

Bhattacharya, Sujit Constructing indicators from patent specifications: What they reveal and what they imply?, 2006 . In International Workshop on Webometrics, Informetrics and Scientometrics & Seventh COLLNET Meeting, Nancy (France), May 10 - 12, 2006. (Unpublished) [Conference paper]

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English abstract

The study distinguishes some of the rich sources of information that can be extracted from a patent document and can act as an indicator to measure some of the technological features of patenting activity of a firm/country. The paper attempts to highlight this through empirical examination of patents granted to Indian institutions in the US. The applicability of the indicators that are distinguished and meaning they can convey are addressed in this study.

Item type: Conference paper
Keywords: patents, Indian institutions
Subjects: B. Information use and sociology of information
Depositing user: Heather G Morrison
Date deposited: 06 Jun 2006
Last modified: 02 Oct 2014 12:03
URI: http://hdl.handle.net/10760/7646

References

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H. Grupp, Foundations of the Economics of Innovation — Theory, measurement and practice. Edward Elger, Cheltenham, 1998.

V. Irish. How to reada patent specification, Engineering Management Journal, pages 71-74, April 2000.

Patents and innovations in the international context. OECD/GD(97)210. OECD:Paris, 1997.

Indian Patenting Activity in International and domestic patent system. Report by NISTADS for the Office of the Principal scientific Advisor, Govt. of India (2005). Principal Author: Sujit Bhattacharya. (ISBN:81-85121-34-6)

Patents and Innovation: trends and Policy Challenges. OECD, 2004

Grupp, Hariolf and U. Schmoch, Patent statistics in the age of globalisation: new legal procedures, new analytical methods, new economic interpretation, Research Policy, 28: 4, pages 377-396, 1998.


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